Bryan J. Robbins

According to our database, Bryan J. Robbins authored at least 8 papers between 1997 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2010

A 32nm 0.5V-supply dual-read 6T SRAM.

Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Sudesh Saroop, Tuyet Nguyen, Thomas Fröhnel, Antje Müller, Christopher M. Durham, Rolf Sautter, Bryan Lloyd, Bryan J. Robbins, Juergen Pille, Sani R. Nassif, Kevin J. Nowka

Proceedings of the IEEE Custom Integrated Circuits Conference, 2010

2009

Structural and functional test of IBM System z10 chips.

Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur

IBM J. Res. Dev., 2009

2007

IBM System z9 eFUSE applications and methodology.

Richard F. Rizzolo, Thomas G. Foote, James M. Crafts, David A. Grosch, Tak O. Leung, David J. Lund, Bryan L. Mechtly, Bryan J. Robbins, Timothy J. Slegel, Michael J. Tremblay, Glen A. Wiedemeier

IBM J. Res. Dev., 2007

2001

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.

Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

Testing the 500-MHz IBM S/390 Microprocessor.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins

IEEE Des. Test Comput., 1998

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.

Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Advanced microprocessor test strategy and methodology.

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen

IBM J. Res. Dev., 1997

Testing the 400-MHz IBM Generation-4 CMOS Chip.

Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997