Bryan C. Waltrip

According to our database, Bryan C. Waltrip authored at least 22 papers between 1998 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Measurement of the Frequency Dependence of Four Terminal-Pair Air Capacitors With a Vector Network Analyzer.

Stephan Schlamminger, Andrew D. Koffman, James W. Schmidt, Bryan C. Waltrip, Yicheng Wang

IEEE Trans. Instrum. Meas., 2023

2022

Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge.

Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang

IEEE Trans. Instrum. Meas., 2022

2021

Comparison of AC Power Referenced to Either PJVS or JAWS.

Bryan C. Waltrip, Thomas L. Nelson, Mike Berilla, Nathan E. Flowers-Jacobs, Paul D. Dresselhaus

IEEE Trans. Instrum. Meas., 2021

2019

A Sampling Wattmeter With Extended Frequency Range.

Bryan C. Waltrip, Shannon Edwards, Tom L. Nelson, Mike Berilla

IEEE Trans. Instrum. Meas., 2019

2017

A Programmable Capacitor for Inductance Measurements.

Bryan C. Waltrip, Frank Seifert

IEEE Trans. Instrum. Meas., 2017

2015

A Comparison Between the NIST PJVS-Based Power Standard and the NRC Current- Comparator-Based Power Standard.

Bryan C. Waltrip, Thomas L. Nelson, Eddy So, David Angelo

IEEE Trans. Instrum. Meas., 2015

A 600 V AC Voltage Amplifier for Power Measurements.

Bryan C. Waltrip, Owen B. Laug, Thomas L. Nelson

IEEE Trans. Instrum. Meas., 2015

2009

AC Power Standard Using a Programmable Josephson Voltage Standard.

Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus

IEEE Trans. Instrum. Meas., 2009

Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard.

Alain Rüfenacht, Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson

IEEE Trans. Instrum. Meas., 2009

2008

Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards.

Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson

IEEE Trans. Instrum. Meas., 2008

2007

Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards.

Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr

IEEE Trans. Instrum. Meas., 2007

Evaluation of a Capacitance Scaling System.

Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang

IEEE Trans. Instrum. Meas., 2007

2005

Intercomparison of calibration systems for AC shunts up to audio frequencies.

Eddy So, Dave Angelo, Takuhiro Tsuchiyama, Takuya Tadokoro, Bryan C. Waltrip, Tom L. Nelson

IEEE Trans. Instrum. Meas., 2005

2004

Low thermal error sampling comparator for accurate settling measurements.

David I. Bergman, Bryan C. Waltrip

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequencies.

Eddy So, Réjean Arseneau, David Bennett, Thomas L. Nelson, Bryan C. Waltrip

IEEE Trans. Instrum. Meas., 2003

A low-noise latching comparator probe for waveform sampling applications.

David I. Bergman, Bryan C. Waltrip

IEEE Trans. Instrum. Meas., 2003

2001

Improved time-base for waveform parameter estimation.

Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken

IEEE Trans. Instrum. Meas., 2001

Nonrandom quantization errors in timebases.

Gerard N. Stenbakken, Dong Liu, Janusz A. Starzyk, Bryan C. Waltrip

IEEE Trans. Instrum. Meas., 2001

Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST.

Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip

IEEE Trans. Instrum. Meas., 2001

2000

Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz.

Andrew D. Koffman, Svetlana Avramov-Zamurovic, Bryan Cristopher Waltrip, Nile M. Oldham

IEEE Trans. Instrum. Meas., 2000

The sensitivity of a method to predict a capacitor's frequency characteristic.

Svetlana Avramov-Zamurovic, Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip

IEEE Trans. Instrum. Meas., 2000

1998

Low-frequency characteristics of thin-film multijunction thermal voltage converters.

Svetlana Avramov-Zamurovic, Nile M. Oldham, Mark E. Parker, Bryan Christopher Waltrip

IEEE Trans. Instrum. Meas., 1998