Bruce Swanson

According to our database, Bruce Swanson authored at least 6 papers between 2002 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Detecting and diagnosing open defects.

Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson

Proceedings of the 2011 IEEE International Test Conference, 2010

2008

A Real Case of Significant Scan Test Cost Reduction.

Selina Sha, Bruce Swanson

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2008

2006

Improved Handling of False and Multicycle Paths in ATPG.

Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

At-Speed Testing with Timing Exceptions and Constraints-Case Studies.

Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Takeo Kobayashi, Janusz Rajski, Bruce Swanson, Darryl Walters, Yasuo Sato, Toshiharu Asaka, Takashi Aikyo

Proceedings of the 15th Asian Test Symposium, 2006

2003

High-Frequency, At-Speed Scan Testing.

Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli

IEEE Des. Test Comput., 2003

2002

Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture.

Nandu Tendolkar, Rajesh Raina, Rick Woltenberg, Xijiang Lin, Bruce Swanson, Greg Aldrich

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002