Brett Hull
According to our database1,
Brett Hull
authored at least 5 papers
between 2018 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
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2024
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Bibliography
2024
Hole-Induced Threshold Voltage Instability Under High Positive and Negative Gate Stress in SiC MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018