Bram Kruseman
According to our database1,
Bram Kruseman
authored at least 32 papers
between 1999 and 2016.
Collaborative distances:
Collaborative distances:
Timeline
2000
2002
2004
2006
2008
2010
2012
2014
2016
0
1
2
3
4
5
6
1
3
2
1
1
1
1
3
3
3
3
2
3
1
1
1
1
1
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2016
2015
Proceedings of the 20th IEEE European Test Symposium, 2015
2013
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes?
Proceedings of the 18th IEEE European Test Symposium, 2013
2012
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
IEEE Des. Test Comput., 2012
2011
IEEE Trans. Very Large Scale Integr. Syst., 2011
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
Proceedings of the 2011 IEEE International Test Conference, 2011
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices.
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
Proceedings of the Design, Automation and Test in Europe, 2011
2010
Proceedings of the VLSI Design 2010: 23rd International Conference on VLSI Design, 2010
Proceedings of the 15th European Test Symposium, 2010
NIM- a noise index model to estimate delay discrepancies between silicon and simulation.
Proceedings of the Design, Automation and Test in Europe, 2010
2008
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2001
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
2000
Comparison of defect detection capabilities of current-based and voltage-based test methods.
Proceedings of the 5th European Test Workshop, 2000
1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999