Bradford G. Van Treuren

According to our database, Bradford G. Van Treuren authored at least 14 papers between 2003 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

IEEE P1687.1: Extending the Network Boundaries for Test.

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo

Proceedings of the IEEE International Test Conference, 2022

2021

Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces.

Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Modeling Novel Non-JTAG IEEE 1687-Like Architectures.

Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick

Proceedings of the IEEE International Test Conference, 2020

2013

Executing IJTAG: Are Vectors Enough?

Michele Portolan, Bradford G. Van Treuren, Suresh Goyal

IEEE Des. Test, 2013

2010

A Common Language Framework for Next-Generation Embedded Testing.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook

IEEE Des. Test Comput., 2010

Scan chain securization though Open-Circuit Deadlocks.

Michele Portolan, Bradford G. Van Treuren, Suresh Goyal

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Scalable and efficient integrated test architecture.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Problems Using Boundary-Scan for Memory Cluster Tests.

Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker

Proceedings of the 2008 IEEE International Test Conference, 2008

System JTAG Initiative Group Advancements.

Bradford G. Van Treuren

Proceedings of the 2008 IEEE International Test Conference, 2008

A New Language Approach for IJTAG.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

JTAG system test in a MicroTCA world.

Bradford G. Van Treuren, Adam W. Ley

Proceedings of the 2007 IEEE International Test Conference, 2007

A practical approach to comprehensive system test & debug using boundary scan based test architecture.

Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren

Proceedings of the 2007 IEEE International Test Conference, 2007

2005

JTAG-based vector and chain management for system test.

Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

Embedded Boundary Scan.

Bradford G. Van Treuren, José M. Miranda

IEEE Des. Test Comput., 2003