Brad Cobb
According to our database1,
Brad Cobb
authored at least 4 papers
between 2000 and 2004.
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Bibliography
2004
Proceedings of the 2004 Design, 2004
2002
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.
Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.
Proceedings of the 2002 Design, 2002
2000
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000