Boxue Yin
According to our database1,
Boxue Yin
authored at least 11 papers
between 2009 and 2022.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2022
Proc. VLDB Endow., 2022
2016
Proceedings of the 2016 IEEE Trustcom/BigDataSE/ISPA, 2016
Proceedings of the 23rd IEEE International Conference on High Performance Computing, 2016
2014
Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing.
IEEE Trans. Very Large Scale Integr. Syst., 2014
2010
IET Comput. Digit. Tech., 2010
2009
Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009
A power-effective scan architecture using scan flip-flops clustering and post-generation filling.
Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009
Proceedings of the Eighteentgh Asian Test Symposium, 2009
Conflict driven scan chain configuration for high transition fault coverage and low test power.
Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009