Boubekeur Tala-Ighil

According to our database, Boubekeur Tala-Ighil authored at least 11 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET.

Boubekeur Tala-Ighil, Jean-Lionel Trolet, Hamid Gualous, Philippe Mary, Stéphane Lefebvre

Microelectron. Reliab., 2015

2013

Supercapacitors aging diagnosis using least square algorithm.

Amrane Oukaour, Mathieu Pouliquen, Boubekeur Tala-Ighil, Hamid Gualous, Eric Pigeon, Olivier Gehan, Bertrand Boudart

Microelectron. Reliab., 2013

2012

Calendar and cycling ageing of activated carbon supercapacitor for automotive application.

Hamid Gualous, Roland Gallay, Monzer Al Sakka, Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Boudart

Microelectron. Reliab., 2012

2011

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour.

Boubekeur Tala-Ighil, Amrane Oukaour, Hamid Gualous, Bertrand Boudart, Bertrand Pouderoux, Jean-Lionel Trolet, Marc Piccione

Microelectron. Reliab., 2011

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition.

Amrane Oukaour, Boubekeur Tala-Ighil, Bertrand Pouderoux, M. Tounsi, M. Bouarroudj-Berkani, Stéphane Lefebvre, Bertrand Boudart

Microelectron. Reliab., 2011

2010

Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature.

M. Tounsi, Amrane Oukaour, Boubekeur Tala-Ighil, Hamid Gualous, Bertrand Boudart, Djamil Aïssani

Microelectron. Reliab., 2010

Supercapacitor ageing at constant temperature and constant voltage and thermal shock.

Hamid Gualous, Roland Gallay, G. Alcicek, Boubekeur Tala-Ighil, Amrane Oukaour, Bertrand Boudart, Philippe Makany

Microelectron. Reliab., 2010

2005

Trench insulated gate bipolar transistors submitted to high temperature bias stress.

Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart

Microelectron. Reliab., 2005

2004

Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress.

Cheick Oumar Maïga, Hamid Toutah, Boubekeur Tala-Ighil, Bertrand Boudart

Microelectron. Reliab., 2004

2003

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.

Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, Bertrand Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud

Microelectron. Reliab., 2003

2001

Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating.

Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud

Microelectron. Reliab., 2001