Bong-Jin Yum
According to our database1,
Bong-Jin Yum
authored at least 21 papers
between 2002 and 2023.
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Bibliography
2023
A bibliography of the literature on process capability indices (PCIs): 2010-2021, Part II: Multivariate PCI- and functional PCI-related papers, special applications, software packages, and omitted papers.
Qual. Reliab. Eng. Int., June, 2023
A bibliography of the literature on process capability indices (PCIs): 2010-2021, Part I: Books, review/overview papers, and univariate PCI-related papers.
Qual. Reliab. Eng. Int., June, 2023
2018
Application of kernel principal component analysis to multi-characteristic parameter design problems.
Ann. Oper. Res., 2018
2016
A Multivariate Loss Function Approach to Robust Design of Systems with Multiple Performance Characteristics.
Qual. Reliab. Eng. Int., 2016
2015
J. Oper. Res. Soc., 2015
2012
Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
2011
Qual. Reliab. Eng. Int., 2011
Expert Syst. Appl., 2011
Expert Syst. Appl., 2011
Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern.
Expert Syst. Appl., 2011
Expert Syst. Appl., 2011
2008
A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator.
Microelectron. Reliab., 2008
Selection between Weibull and lognormal distributions: A comparative simulation study.
Comput. Stat. Data Anal., 2008
2007
Robust design of communication systems: The case of expedited forwarding of voice traffic in differentiated services networks.
Int. J. Commun. Syst., 2007
IEICE Trans. Commun., 2007
2005
Development of a recommender system based on navigational and behavioral patterns of customers in e-commerce sites.
Expert Syst. Appl., 2005
Expert Syst. Appl., 2005
2004
Eng. Appl. Artif. Intell., 2004
2003
Int. J. Manuf. Technol. Manag., 2003
2002
Development of a Framework for Analyzing Process Monitoring Data with Applications to Semiconductor Manufacturing Process.
Proceedings of the COMPSTAT 2002, 2002