Bjorn Vermeersch

According to our database, Bjorn Vermeersch authored at least 18 papers between 2006 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Thermal Considerations for Block-Level PPA Assessment in Angstrom Era: A Comparison Study of Nanosheet FETs (A10) & Complementary FETs (A5).

S. Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, Gioele Mirabelli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation.

Subrat Mishra, Bjorn Vermeersch, Sankatali Venkateswarlu, Halil Kukner, A. Sharma, G. Mirabeli, Fabian M. Bufler, Moritz Brunion, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Francky Catthoor, Pieter Weckx, Geert Hellings, James Myers, Julien Ryckaert

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC.

Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Dwaipayan Biswas, Pieter Weckx, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., December, 2023

Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs).

Subrat Mishra, Sankatali Venkateswarlu, Bjorn Vermeersch, Moritz Brunion, Melina Lofrano, Dawit Burusie Abdi, Herman Oprins, Dwaipayan Biswas, Odysseas Zografos, Gaspard Hiblot, Geert Van der Plas, Pieter Weckx, Geert Hellings, James Myers, Francky Catthoor, Julien Ryckaert

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Towards accurate temperature prediction in BEOL for reliability assessment (Invited).

Melina Lofrano, Herman Oprins, Xinyue Chang, Bjorn Vermeersch, Olalla Varela Pedreira, Alicja Lesniewska, Vladimir Cherman, Ivan Ciofi, Kristof Croes, Seongho Park, Zsolt Tokei

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Thermal Performance Analysis of Mempool RISC-V Multicore SoC.

Sankatali Venkateswarlu, Subrat Mishra, Herman Oprins, Bjorn Vermeersch, Moritz Brunion, Jun-Han Han, Mircea R. Stan, Pieter Weckx, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2022

Self-Heating in iN8-iN2 CMOS Logic Cells: Thermal Impact of Architecture (FinFET, Nanosheet, Forksheet and CFET) and Scaling Boosters.

Bjorn Vermeersch, Erik Bury, Yang Xiang, Pieter Schuddinck, Krishna K. Bhuwalka, Geert Hellings, Julien Ryckaert

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance.

Abhitosh Vais, Sachin Yadav, Yves Mols, Bjorn Vermeersch, Komal Vondkar Kodandarama, Marina Baryshnikova, G. Mannaert, R. Alcotte, Geert Boccardi, Piet Wambacq, Bertrand Parvais, R. Langer, Bernardette Kunert, Nadine Collaert

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer.

AliReza Alian, Raúl Rodríguez, Sachin Yadav, Uthayasankaran Peralagu, Arturo Sibaja Hernandez, Vamsi Putcha, Ming Zhao, Rana ElKashlan, Bjorn Vermeersch, Hao Yu, Erik Bury, Ahmad Khaled, Nadine Collaert, Bertrand Parvais

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2021

Performance Trade-Off Scenarios for GAA Nanosheet FETs Considering Inner-spacers and Epi-induced Stress: Understanding & Mitigating Process Risks.

Amita Rawat, Krishna K. Bhuwalka, Philippe Matagne, Bjorn Vermeersch, Hao Wu, Geert Hellings, Julien Ryckaert, Changze Liu

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2017

almaBTE : A solver of the space-time dependent Boltzmann transport equation for phonons in structured materials.

Jesús Carrete, Bjorn Vermeersch, Ankita Katre, Ambroise van Roekeghem, Tao Wang, Georg K. H. Madsen, Natalio Mingo

Comput. Phys. Commun., 2017

2011

Generation of reduced dynamic thermal models of electronic systems from time constant spectra of transient temperature responses.

Marcin Janicki, Jedrzej Banaszczyk, Bjorn Vermeersch, Gilbert De Mey, Andrzej Napieralski

Microelectron. Reliab., 2011

2009

Dynamic electrothermal simulation of integrated resistors at device level.

Bjorn Vermeersch, Gilbert De Mey

Microelectron. J., 2009

Dynamic thermal modelling of a power integrated circuit with the application of structure functions.

Marcin Janicki, Jedrzej Banaszczyk, Gilbert De Mey, Marek Kaminski, Bjorn Vermeersch, Andrzej Napieralski

Microelectron. J., 2009

2008

Dependency of thermal spreading resistance on convective heat transfer coefficient.

Bjorn Vermeersch, Gilbert De Mey

Microelectron. Reliab., 2008

2007

Influence of thermal contact resistance on thermal impedance of microelectronic structures.

Bjorn Vermeersch, Gilbert De Mey

Microelectron. Reliab., 2007

Influence of substrate thickness on thermal impedance of microelectronic structures.

Bjorn Vermeersch, Gilbert De Mey

Microelectron. Reliab., 2007

2006

Thermal impedance plots of micro-scaled devices.

Bjorn Vermeersch, Gilbert De Mey

Microelectron. Reliab., 2006