Biswajit Ray

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Life-after-Death: Exploring Thermal Annealing Conditions to Enhance 3D NAND SSD Endurance.

[BibT_eX]

[DOI]

Sudeep Pasricha

Proceedings of the 16th ACM Workshop on Hot Topics in Storage and File Systems, 2024

Improving Block Management in 3D NAND Flash SSDs with Sub-Block First Write Sequencing.

[BibT_eX]

[DOI]

Kamil Khan

Sudeep Pasricha

Umeshwarnath Surendranathan

Proceedings of the Great Lakes Symposium on VLSI 2024, 2024

Technology Scaling Effects on SRAM Data Remanence.

[BibT_eX]

[DOI]

Farzana Hoque

Proceedings of the Device Research Conference, 2024

2023

Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Towards Improving Ionizing Radiation Tolerance of 3-D NAND Flash Memory.

[BibT_eX]

[DOI]

Mondol Anik Kumar

Proceedings of the IEEE International Memory Workshop, 2023

Hide-and-Seek: Hiding Secrets in Threshold Voltage Distributions of NAND Flash Memory Cells.

[BibT_eX]

[DOI]

Md Raquibuzzaman

Umeshwarnath Surendranathan

Proceedings of the 15th ACM/USENIX Workshop on Hot Topics in Storage and File Systems, 2023

Technology scaling effects on SRAM-PUF reliability under ionizing radiation.

[BibT_eX]

[DOI]

Horace Wilson

Proceedings of the Device Research Conference, 2023

Overcoming the low cell current bottleneck of 3D NAND flash memory array with novel device design.

[BibT_eX]

[DOI]

Sijay Huang

Proceedings of the Device Research Conference, 2023

2022

Instant data sanitization on multi-level-cell NAND flash memory.

[BibT_eX]

[DOI]

Md Raquibuzzaman

Proceedings of the SYSTOR '22: The 15th ACM International Systems and Storage Conference, Haifa, Israel, June 13, 2022

Layer-to-Layer Endurance Variation of 3D NAND Flash Memory.

[BibT_eX]

[DOI]

Md Raquibuzzaman

Md. Mehedi Hasan

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Microcontroller Fingerprinting Using Partially Erased NOR Flash Memory Cells.

[BibT_eX]

[DOI]

Prawar Poudel

ACM Trans. Embed. Comput. Syst., 2021

Runtime Variability Monitor for Data Retention Characteristics of Commercial NAND Flash Memory.

[BibT_eX]

[DOI]

Sadman Sakib

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Data Recovery from "Scrubbed" NAND Flash Storage: Need for Analog Sanitization.

[BibT_eX]

[DOI]

Md. Mehedi Hasan

Proceedings of the 29th USENIX Security Symposium, 2020

Radiation Tolerance of 3-D NAND Flash Based Neuromorphic Computing System.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Towards the Avoidance of Counterfeit Memory: Identifying the DRAM Origin.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Symposium on Hardware Oriented Security and Trust, 2020

Flashmark: Watermarking of NOR Flash Memories for Counterfeit Detection.

[BibT_eX]

[DOI]

Prawar Poudel

Proceedings of the 57th ACM/IEEE Design Automation Conference, 2020

2019

Microcontroller TRNGs Using Perturbed States of NOR Flash Memory Cells.

[BibT_eX]

[DOI]

Prawar Poudel

IEEE Trans. Computers, 2019

PreLatPUF: Exploiting DRAM Latency Variations for Generating Robust Device Signatures.

[BibT_eX]

[DOI]

Domenic Forte

Md. Tauhidur Rahman

IEEE Access, 2019

Tolerance of Deep Neural Network Against the Bit Error Rate of NAND Flash Memory.

[BibT_eX]

[DOI]

Mehedi Hasan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Exploiting DRAM Latency Variations for Generating True Random Numbers.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Consumer Electronics, 2019

Machine Learning Assisted Accurate Estimation of Usage Duration and Manufacturer for Recycled and Counterfeit Flash Memory Detection.

[BibT_eX]

[DOI]

Saranyu Chattopadhyay

Rajat Subhra Chakraborty

Proceedings of the 28th IEEE Asian Test Symposium, 2019

2018

Non-Invasive Detection Method for Recycled Flash Memory Using Timing Characteristics <sup>†</sup>.

[BibT_eX]

[DOI]

Sadman Sakib

Md. Tauhidur Rahman

Cryptogr., 2018

LDPUF: Exploiting DRAM Latency Variations to Generate Robust Device Signatures.

[BibT_eX]

[DOI]

CoRR, 2018

True Random Number Generator using Solar Output Characteristics.

[BibT_eX]

[DOI]

Proceedings of the 6th IEEE International Conference on Wireless for Space and Extreme Environments, 2018

Wireless Passive Radiation Dosimeter Using Flash Memory.

[BibT_eX]

[DOI]

Proceedings of the 6th IEEE International Conference on Wireless for Space and Extreme Environments, 2018

Independent detection of recycled flash memory: Challenges and solutions.

[BibT_eX]

[DOI]

Sadman Sakib

Md. Tauhidur Rahman

Proceedings of the 2018 IEEE International Symposium on Hardware Oriented Security and Trust, 2018

2013

Redefining the Operation and Design Considerations of Organic Solar Cells: Role of Morphology and Defect States

[BibT_eX]

[DOI]

PhD thesis, 2013

2008

A New Threshold Voltage Model for Omega Gate Cylindrical Nanowire Transistor.

[BibT_eX]

[DOI]

Santanu Mahapatra

Proceedings of the 21st International Conference on VLSI Design (VLSI Design 2008), 2008

1993

Bidirectional DC/DC power conversion using constant-frequency quasi-resonant topology.

[BibT_eX]