Bipul Chandra Paul
Affiliations:- Purdue University, West Lafayette, USA
According to our database1,
Bipul Chandra Paul
authored at least 36 papers
between 2000 and 2022.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
On csauthors.net:
Bibliography
2022
A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement.
Proceedings of the IEEE International Memory Workshop, 2022
2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
2018
A Retrospective View on the Technology Evolution to Support Low Power Mobile Application.
J. Low Power Electron., 2018
2013
ACM J. Emerg. Technol. Comput. Syst., 2013
2011
Proceedings of the Low-Power Variation-Tolerant Design in Nanometer Silicon, 2011
2009
IEEE J. Solid State Circuits, 2009
IET Comput. Digit. Tech., 2009
2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
2007
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
ACM J. Emerg. Technol. Comput. Syst., 2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
2006
Statistical timing analysis using levelized covariance propagation considering systematic and random variations of process parameters.
ACM Trans. Design Autom. Electr. Syst., 2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
J. Electron. Test., 2006
Ultralow power computing with sub-threshold leakage: a comparative study of bulk and SOI technologies.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
Proceedings of the 43rd Design Automation Conference, 2006
2005
Computing with subthreshold leakage: device/circuit/architecture co-design for ultralow-power subthreshold operation.
IEEE Trans. Very Large Scale Integr. Syst., 2005
IEEE Trans. Very Large Scale Integr. Syst., 2005
Process variation in embedded memories: failure analysis and variation aware architecture.
IEEE J. Solid State Circuits, 2005
Proceedings of the 2005 Design, 2005
2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the 2004 International Symposium on Low Power Electronics and Design, 2004
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004
Novel sizing algorithm for yield improvement under process variation in nanometer technology.
Proceedings of the 41th Design Automation Conference, 2004
Process variation in nano-scale memories: failure analysis and process tolerant architecture.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004
Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004
2002
Proceedings of the 7th Asia and South Pacific Design Automation Conference (ASP-DAC 2002), 2002
Testing CrossTalk Induced Delay Faults in Static CMOS Circuits Through Dynamic Timing Analysis.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2001
IEEE Trans. Very Large Scale Integr. Syst., 2001
Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001
2000
Proceedings of the 2000 International Symposium on Low Power Electronics and Design, 2000