Bing Long
Orcid: 0000-0003-1876-9013
According to our database1,
Bing Long
authored at least 30 papers
between 2008 and 2024.
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Bibliography
2024
A Novel Method for Remaining Useful Life Prediction of RF Circuits Based on the Gated Recurrent Unit-Convolutional Neural Network Model.
Sensors, May, 2024
2023
Estimation and prediction for the Rayleigh distribution based on double Type-I hybrid censored data.
Commun. Stat. Simul. Comput., August, 2023
Proceedings of the CAA Symposium on Fault Detection, 2023
2022
A general enhancement method for test strategy generation for the sequential fault diagnosis of complex systems.
Reliab. Eng. Syst. Saf., 2022
2021
Proceedings of the ICIT 2021: IoT and Smart City, Guangzhou, China, December 22 - 25, 2021, 2021
2020
Multi-Parameter Optimization Method for Remaining Useful Life Prediction of Lithium-Ion Batteries.
IEEE Access, 2020
2017
Microelectron. Reliab., 2017
J. Electron. Test., 2017
2014
Prognostics of Lithium-Ion Batteries Based on the Verhulst Model, Particle Swarm Optimization and Particle Filter.
IEEE Trans. Instrum. Meas., 2014
Microelectron. J., 2014
Improved diagnostics for the incipient faults in analog circuits using LSSVM based on PSO algorithm with Mahalanobis distance.
Neurocomputing, 2014
A Novel Prediction Method for Analog Circuits Based on Gaussian White Noise Estimation.
Proceedings of the 17th IEEE International Conference on Computational Science and Engineering, 2014
2013
IEEE Trans. Ind. Electron., 2013
An improved autoregressive model by particle swarm optimization for prognostics of lithium-ion batteries.
Microelectron. Reliab., 2013
Finite-time parameter identification and adaptive synchronization between two chaotic neural networks.
J. Frankl. Inst., 2013
J. Electron. Test., 2013
Circuits Syst. Signal Process., 2013
2012
Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics of Analog Circuits Based on LS-SVM.
J. Electron. Test., 2012
Diagnostics of Filtered Analog Circuits with Tolerance Based on LS-SVM Using Frequency Features.
J. Electron. Test., 2012
2011
Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis.
IEEE Trans. Instrum. Meas., 2011
Signal Image Video Process., 2011
Circuits Syst. Signal Process., 2011
2010
IEEE Trans. Instrum. Meas., 2010
IEEE Intell. Transp. Syst. Mag., 2010
J. Electron. Test., 2010
J. Electron. Test., 2010
A Novel Method for the Diagnosis of the Incipient Faults in Analog Circuits Based on LDA and HMM.
Circuits Syst. Signal Process., 2010
2009
Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques.
IEEE Trans. Instrum. Meas., 2009
J. Electron. Test., 2009
2008
Proceedings of the PACIIA 2008, 2008