Bill Underwood

According to our database, Bill Underwood authored at least 11 papers between 1984 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

Speed Binning with Path Delay Test in 150-nm Technology.

Bruce Cory, Rohit Kapur, Bill Underwood

IEEE Des. Test Comput., 2003

1994

Fastpath: A Path-Delay Test Generator for Standard Scan Designs.

Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Path-Delay Fault Simulation for a Standard Scan Design Methodology.

Sungho Kang, Wai-On Law, Bill Underwood

Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

1991

Delay Testing Quality in Timing-Optimized Designs.

Eun Sei Park, Bill Underwood, Thomas W. Williams, M. Ray Mercer

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

The Interdependence Between Delay-Optimization of Synthesized Networks and Testing.

Thomas W. Williams, Bill Underwood, M. Ray Mercer

Proceedings of the 28th Design Automation Conference, 1991

1989

The Parallel-Test-Detect Fault Simulation Algorithm.

Bill Underwood, Jack Ferguson

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

D^3FS: A Demand Driven Deductive Fault Simulator.

Steven P. Smith, Bill Underwood, M. Ray Mercer

Proceedings of the Proceedings International Test Conference 1988, 1988

An Analysis of Parallel Logic Simulation on Several Architectures.

Steven P. Smith, Bill Underwood, Joe Newman

Proceedings of the International Conference on Parallel Processing, 1988

1986

Calculation of Greatest Lower Bounds Obtainable by the Cutting Algorithm.

Rhonda Kay Gaede, M. Ray Mercer, Bill Underwood

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

Built-In Self Test Input Generator for Programmable Logic Arrays.

John Salick, Bill Underwood, M. Ray Mercer

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Correlating Testability with Fault Detection.

Bill Underwood, M. Ray Mercer

Proceedings of the Proceedings International Test Conference 1984, 1984