Bill Bottoms
According to our database1,
Bill Bottoms
authored at least 4 papers
between 1998 and 2002.
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Collaborative distances:
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Bibliography
2002
A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution?
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2001
Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
1998