Bhawani Shankar
Orcid: 0000-0002-5646-001X
According to our database1,
Bhawani Shankar
authored at least 7 papers
between 2017 and 2022.
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Bibliography
2022
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.
Proceedings of the Device Research Conference, 2022
2019
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis.
Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017
Proceedings of the Autonomous Vehicles and Machines 2017, Burlingame, CA, USA, January 29, 2017