Bhawani Shankar

Orcid: 0000-0002-5646-001X

According to our database1, Bhawani Shankar authored at least 7 papers between 2017 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode Under UIS Stress for Edge-termination Optimization.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

Movement of Current Filaments and its Impact on Avalanche Robustness in Vertical GaN P-N diode Under UIS stress.
Proceedings of the Device Research Conference, 2022

2019
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017
ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis.
Proceedings of the 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, 2017

Face Pose Estimation From Rigid Face Landmarks For Driver Monitoring Systems.
Proceedings of the Autonomous Vehicles and Machines 2017, Burlingame, CA, USA, January 29, 2017


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