Bertrand Vrignon

According to our database, Bertrand Vrignon authored at least 8 papers between 2011 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2015

Near-field injection on a Safe System Basis Chip at silicon level.

Bertrand Vrignon, A. Doridant, K. Abouda, Y. Gao, D. Pagnoux, T. Marek

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2014

Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI).

Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

2013

LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.

Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon

Microelectron. Reliab., 2013

Automatic verification of EMC immunity by simulation.

Bertrand Vrignon, P. Caunegre, John Shepherd, Jianfei Wu

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2012

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations.

Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh

IEEE Trans. Instrum. Meas., 2012

IC Immunity Modeling Process Validation Using On-Chip Measurements.

Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro

J. Electron. Test., 2012

Prediction of Long-term Immunity of a Phase-Locked Loop.

Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon

J. Electron. Test., 2012

2011

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior.

Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon

IEICE Trans. Electron., 2011