Bernd Könemann

According to our database1, Bernd Könemann authored at least 9 papers between 1992 and 2003.

Collaborative distances:

Timeline

1992
1994
1996
1998
2000
2002
0
1
2
3
4
1
1
1
2
1
3

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2003
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities.
Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003

2002
Extending OPMISR beyond 10x Scan Test Efficiency.
IEEE Des. Test Comput., 2002

2001
OPMISR: the foundation for compressed ATPG vectors.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

A SmartBIST Variant with Guaranteed Encoding.
Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1996
Built-In Self-Test: Assuring System Integrity.
Computer, 1996

1993
Testable Programmable Digital Clock Pulse Control Elements.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992
A Test Generation Methodology for High-Performance Computer Chips and Modules.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Delay Test: The Next Frontier for LSSD Test Systems.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

AC Test Quality: Beyond Transition Fault Coverage.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992


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