Bernd Deutschmann
Orcid: 0000-0001-7973-6835
According to our database1,
Bernd Deutschmann
authored at least 47 papers
between 2003 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
-
on orcid.org
On csauthors.net:
Bibliography
2024
Bias dependence in statistical random telegraph noise analysis based on nanoscale CMOS ring oscillators.
Elektrotech. Informationstechnik, March, 2024
A modular and scalable system for electromagnetic compatibility testing of integrated circuits.
Elektrotech. Informationstechnik, March, 2024
Influence of the IC power supply and decoupling capacitor arrangement on the electromagnetic emission.
Elektrotech. Informationstechnik, March, 2024
Electromagnetic emission of integrated circuits induced by ionizing radiation and its measurement uncertainties.
Elektrotech. Informationstechnik, March, 2024
Characterisation of an EMI-Improved Integrated Folded Cascode Amplifier Structure Using the EMIRR Measurement Method.
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
Evaluation of the Electromagnetic Emission of ICs Using Different Spread Spectrum Approaches.
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
Effects of Ionizing Radiation on the EMI-Induced Offset Voltage of Operational Amplifiers.
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
2023
Elektrotech. Informationstechnik, February, 2023
Framework to Simulate and Analyse the Electromagnetic Emission of Integrated Circuits under Electromagnetic Interference.
Proceedings of the 19th International Conference on Synthesis, 2023
A Sub-100 mV AC/DC Converter with Impedance Matching for Magnetic Field Energy Harvesting.
Proceedings of the 18th Conference on Ph.D Research in Microelectronics and Electronics, 2023
2021
Elektrotech. Informationstechnik, 2021
Leistungselektronik/Leistungshalbleiter - Anwendungen von Milliwatt bis Megawatt, vom Mikrochip bis zum System.
Elektrotech. Informationstechnik, 2021
2020
Integr., 2020
Comparison of EMI effects on different current mirror structures using a post-processing framework.
Elektrotech. Informationstechnik, 2020
Elektrotech. Informationstechnik, 2020
2019
Erratum to: Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance.
Elektrotech. Informationstechnik, 2019
Identification of EMI Induced Changes During the Design of ICs using a Post-Processing Framework.
Proceedings of the 16th International Conference on Synthesis, 2019
Proceedings of the 15th Conference on Ph.D. Research in Microelectronics and Electronics, 2019
Proceedings of the 15th Conference on Ph.D. Research in Microelectronics and Electronics, 2019
Survey on the Generation of Equivalent Circuit Cable Models for Transient Simulation.
Proceedings of the 42nd International Convention on Information and Communication Technology, 2019
2018
Elektrotech. Informationstechnik, 2018
Innovativer HVDC-DC-Wandler für Hochspannungs-Gleichstrom-Netze - Grundsätzliche Überlegungen zu Topologie, Regelung und elektromagnetischer Verträglichkeit.
Elektrotech. Informationstechnik, 2018
Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance.
Elektrotech. Informationstechnik, 2018
Elektrotech. Informationstechnik, 2018
Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications.
Elektrotech. Informationstechnik, 2018
Mikroelektronik aus Österreich - Grundlage für Österreichs Innovations- und Wettbewerbsfähigkeit.
Elektrotech. Informationstechnik, 2018
Proceedings of the IEEE 61st International Midwest Symposium on Circuits and Systems, 2018
2017
Autonomous maximum power point tracking algorithm for ultra-low power energy harvesting.
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
2016
Intelligent plaster for accurate body temperature monitoring and investigations regarding EMI using near-field magnetic scan.
Elektrotech. Informationstechnik, 2016
Highlighting the distribution path of transient disturbances by near field scanning techniques.
Elektrotech. Informationstechnik, 2016
Von der Blitzentladung bis zu ESD-Testverfahren - Beanspruchungen von Geräten und integrierten Schaltungen sowie normative Anforderungen.
Elektrotech. Informationstechnik, 2016
Elektromagnetische Verträglichkeit und Robustheit elektronischer Systeme als Herausforderung des Technologiezeitalters.
Elektrotech. Informationstechnik, 2016
2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
Simulation of radiated emission during the design phase based on scattering parameter measurement.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
Emission reduction in Class D audio amplifiers by optimizing spread spectrum modulation.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
2013
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
2006
Elektrotech. Informationstechnik, 2006
Elektrotech. Informationstechnik, 2006
EMV elektronischer Unterbaugruppen und integrierter Schaltkreise im Kraftfahrzeug.
Proceedings of the EMV 2006 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, 2006
2003
Measures to Reduce the Electromagnetic Emission of a SoC.
Proceedings of the IFIP VLSI-SoC 2003, 2003
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits.
Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, 2003
Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission].
Proceedings of the 8th European Test Workshop, 2003
Proceedings of the ESSCIRC 2003, 2003