Bernard Courtois

According to our database, Bernard Courtois authored at least 87 papers between 1975 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2019

Special Session (New Topic): Emerging Computing and Testing Techniques.

Max M. Shulaker, Laurent Lebrun, Bozena Kaminska, Bernard Courtois

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2018

Special session on quantum systems: Next challenges in design, test, integration.

Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2014

Special Section NANOTECH 2013.

Bernard Courtois

Microelectron. J., 2014

New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors.

Bozena Kaminska, Bernard Courtois, Mary Ann Maher

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges.

Bozena Kaminska, Bernard Courtois, Chris Bailey

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2013

New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics.

Bozena Kaminska, Bernard Courtois, Soha Hassoun

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond.

Bozena Kaminska, Bernard Courtois, Massimo Alioto

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead.

Marco Casale-Rossi, Alberto L. Sangiovanni-Vincentelli, Luca P. Carloni, Bernard Courtois, Hugo De Man, Antun Domic, Jan M. Rabaey

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Special section NANOTECH 2011.

Bernard Courtois

Microelectron. J., 2012

2010

ICs and MEMS for energy management.

Bernard Courtois

Proceedings of the 11th Latin American Test Workshop, 2010

2009

European Nano Systems 2007.

Bernard Courtois

Microelectron. J., 2009

Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations.

Bernard Courtois, Chandu Visweswariah

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips.

Bernard Courtois, Ali Shakouri

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India.

Bernard Courtois, Kholdoun Torki, Sophie Dumont, Sylvaine Eyraud, Jean-François Paillotin, Gregory di Pendina

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

2008

European Nano Systems 2006.

Bernard Courtois

Microelectron. J., 2008

2007

Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology

Péter G. Szabó, Balázs Németh, Márta Rencz, Bernard Courtois

CoRR, 2007

Heterogeneous systems on chip and systems in package.

Ian O'Connor, Bernard Courtois, Krishnendu Chakrabarty, N. Delorme, M. Hampton, J. Hartung

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Session Abstract.

Bernard Courtois

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005

Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004.

Bernard Courtois

Microelectron. J., 2005

2004

On-chip testing of embedded transducers.

Salvador Mir, Libor Rufer, Bernard Courtois

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

On-chip testing of embedded silicon transducers.

Salvador Mir, Benoît Charlot, Libor Rufer, Bernard Courtois

Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004

Infrastructures for Education, Research and Industry in Microelectronics - A review.

Bernard Courtois

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003

Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen.

Bernard Courtois

it Inf. Technol., 2003

2001

Generation of Electrically Induced Stimuli for MEMS Self-Test.

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois

J. Electron. Test., 2001

Electrically Induced Stimuli For MEMS Self-Test.

Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

CMP: The Access to Advanced Low Costy Manufacturing.

Kholdoun Torki, Bernard Courtois

Proceedings of the 2001 International Conference on Microelectronics Systems Education, 2001

An Analog-based Approach for MEMS Testing.

Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

2000

Design of self-checking fully differential circuits and boards.

Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois

IEEE Trans. Very Large Scale Integr. Syst., 2000

Analog ALC crystal oscillators for high-temperature applications.

Raúl Andrés Bianchi, Jean-Michel Karam, Bernard Courtois

IEEE J. Solid State Circuits, 2000

IDDQ Testing of Submicron CMOS - by Cooling?

Márta Rencz, Vladimír Székely, S. Török, Kholdoun Torki, Bernard Courtois

J. Electron. Test., 2000

Extending Fault-Based Testing to Microelectromechanical Systems.

Salvador Mir, Benoît Charlot, Bernard Courtois

J. Electron. Test., 2000

Towards design and validation of mixed-technology SOCs.

Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz

Proceedings of the 10th ACM Great Lakes Symposium on VLSI 2000, 2000

1999

Guest Editors' Introduction.

Bernard Courtois, R. D. (Shawn) Blanton

IEEE Des. Test Comput., 1999

Design and Test of MEMs.

Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

Advanced Low Cost Manufacturing From CMP Service.

Kholdoun Torki, Bernard Courtois

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 1999

Fault modeling of suspended thermal MEMS.

Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

A Reliable Fail-Safe System.

Marcelo Lubaszewski, Bernard Courtois

IEEE Trans. Computers, 1998

Thermal Monitoring of Self-Checking Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1998

Tracing the Thermal Behavior of ICs.

Vladimír Székely, Márta Rencz, Bernard Courtois

IEEE Des. Test Comput., 1998

Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems.

A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

3D CMOS SOL for high performance computing.

Selim J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois

Proceedings of the 1998 International Symposium on Low Power Electronics and Design, 1998

Microsystems Testing: an Approach and Open Problems.

Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois

Proceedings of the 1998 Design, 1998

1997

CAD Tools for Bridging Microsystems and Foundries.

Jean-Michel Karam, Bernard Courtois, Hicham Boutamine

IEEE Des. Test Comput., 1997

Integrating on-chip temperature sensors into DfT schemes and BIST architectures.

Vladimír Székely, Márta Rencz, Bernard Courtois

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Generation of the HDL-A-model of a micromembrane from its finite-element-description.

Klaus Hofmann, Manfred Glesner, Nicu Sebe, Anca Manuela Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois

Proceedings of the European Design and Test Conference, 1997

CAD and Foundries for Microsystems.

Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner

Proceedings of the 34st Conference on Design Automation, 1997

1996

Unified built-in self-test for fully differential analog circuits.

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1996

Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets.

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1996

Guest editorial.

Bozena Kaminska, Bernard Courtois

J. Electron. Test., 1996

Guest Editors' Introduction: Mixed Analog and Digital Systems.

Bozena Kaminska, Bernard Courtois

IEEE Des. Test Comput., 1996

Second Therminic Workshop.

Bernard Courtois

IEEE Des. Test Comput., 1996

Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits.

Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik

Proceedings of the 1996 European Design and Test Conference, 1996

Applied design and analysis of microsystems.

Jean-Michel Karam, Bernard Courtois, András Poppe, Klaus Hofmann, Márta Rencz, Manfred Glesner, Vladimír Székely

Proceedings of the 1996 European Design and Test Conference, 1996

High level CAD melds microsystems with foundries.

Jean-Michel Karam, Bernard Courtois, M. Bauge

Proceedings of the 1996 European Design and Test Conference, 1996

Thermal Monitoring Of Safety-Critical Integrated Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

Analog checkers with absolute and relative tolerances.

Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois

IEEE Trans. Computers, 1995

Conference Reports.

Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois

IEEE Des. Test Comput., 1995

Frequency-based BIST for analog circuit testin.

Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Mixed-signal circuits and boards for high safety applications.

Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois

Proceedings of the 1995 European Design and Test Conference, 1995

Panel: New Research Problems in the Emerging Test Technology.

Vishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, Parimal Pal Chaudhuri

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1994

Designing self-exercising analogue checkers.

Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Built-in self-test and fault diagnosis of fully differential analogue circuits.

Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois

Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994

1993

Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments.

F. L. Vargas, Michael Nicolaidis, Bernard Courtois

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1992

Towards System level modeling and synthesis.

Ahmed Amine Jerraya, Kevin O'Brien, Inhag Park, Bernard Courtois

Proceedings of the Fifth International Conference on VLSI Design, 1992

On the Design of Self-Checking Boundary Scannable Boards.

Marcelo Lubaszewski, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers.

Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Silicon compilation of hierarchical control sections with unified BIST testability.

Michael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois

Microprocess. Microsystems, 1991

Coupling Electron-Beam Probing with Knowledge-Based Fault Localization.

M. Marzouki, J. Laurent, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

Built-In Self-Test for Multi-Port RAMs.

Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois

Proceedings of the 1991 IEEE/ACM International Conference on Computer-Aided Design, 1991

1990

Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks.

F. Darlay, Bernard Courtois

Proceedings of the European Design Automation Conference, 1990

NAUTILE: a safe environment for silicon compilation.

Philippe Bondono, Ahmed Amine Jerraya, Armand Hornik, Bernard Courtois, D. Bonifas

Proceedings of the European Design Automation Conference, 1990

1989

Random Pattern Testing Versus Deterministic Testing of RAM's.

René David, Antoine Fuentes, Bernard Courtois

IEEE Trans. Computers, 1989

Self-checking logic arrays.

Michael Nicolaidis, Bernard Courtois

Microprocess. Microsystems, 1989

A generalized theory of fail-safe systems.

Michael Nicolaidis, Serge Noraz, Bernard Courtois

Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, 1989

1988

Strongly Code Disjoint Checkers.

Michael Nicolaidis, Bernard Courtois

IEEE Trans. Computers, 1988

Definition and Design of Strongly Language Disjoint Checkers.

Ingrid Jansch, Bernard Courtois

IEEE Trans. Computers, 1988

Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level.

Jean Paul Caisso, Bernard Courtois

Proceedings of the Proceedings International Test Conference 1988, 1988

UBIST version of the SYCO's control section compiler.

Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988

1986

Scanning the issue.

Bernard Courtois, Marco Mezzalama

Proc. IEEE, 1986

Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing.

J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin

Proceedings of the Proceedings International Test Conference 1986, 1986

Principles of the SYCO compiler.

Ahmed Amine Jerraya, Patrick Varinot, Robert Jamier, Bernard Courtois

Proceedings of the 23rd ACM/IEEE Design Automation Conference. Las Vegas, 1986

1984

Functional testing vs. structural testing of RAMs.

H. Sahami, Bernard Courtois

Proceedings of the Fehlertolerierende Rechensysteme, 1984

1983

A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing.

Claire Rubat Du Mérac, P. Jutier, J. Laurent, Bernard Courtois

Pattern Recognit. Lett., 1983

1981

Analytical Testing of Data Processing Sections of Integrated CPUs.

Bernard Courtois

Proceedings of the Proceedings International Test Conference 1981, 1981

1976

Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût.

Bernard Courtois

PhD thesis, 1976

1975

On balancing hardware-firmware for designing a fault-tolerant computers' series.

Bernard Courtois, Gabriele Saucier

Proceedings of the 8th annual workshop on Microprogramming, 1975