Benoît Godard

According to our database, Benoît Godard authored at least 7 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTAC^TM eFlash Memories.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

J. Electron. Test., 2012

2011

On using a SPICE-like TSTAC™ eFlash model for design and test.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010

A two-layer SPICE model of the ATMEL TSTAC^TM eFlash memory technology for defect injection and faulty behavior prediction.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

Proceedings of the 15th European Test Symposium, 2010

2009

NAND flash testing: A preliminary study on actual defects.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories.

Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli

Proceedings of the 13th European Test Symposium, 2008

2007

Architecture for Highly Reliable Embedded Flash Memories.

Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

Evaluation of design for reliability techniques in embedded flash memories.

Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007