Benoit Dubois
Orcid: 0000-0003-1462-2161
According to our database1,
Benoit Dubois
authored at least 3 papers
between 2007 and 2023.
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Bibliography
2023
IEEE Trans. Instrum. Meas., 2023
2009
Modelling of hot-carrier degradation and its application for analog design for reliability.
Microelectron. J., 2009
2007
Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007