Benjamin French
According to our database1,
Benjamin French
authored at least 3 papers
between 2013 and 2016.
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Bibliography
2016
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability.
Microelectron. Reliab., 2016
BioData Min., 2016
2013
Proceedings of the AMIA 2013, 2013