Ben Niewenhuis
According to our database1,
Ben Niewenhuis
authored at least 8 papers
between 2013 and 2019.
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Bibliography
2019
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
2018
2017
Proceedings of the 22nd IEEE European Test Symposium, 2017
2016
Proceedings of the 2016 IEEE International Test Conference, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
2015
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
2014
Logic characterization vehicle design for maximal information extraction for yield learning.
Proceedings of the 2014 International Test Conference, 2014
2013
SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states.
Proceedings of the 2013 IEEE International Test Conference, 2013