Ben Niewenhuis

According to our database, Ben Niewenhuis authored at least 12 papers between 2013 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Improving structural coverage of functional tests with checkpoint signature computation.

Benjamin Niewenhuis, Devanathan Varadarajan

Proceedings of the IEEE International Test Conference, 2022

2019

Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle.

Ben Niewenhuis, Balaji Ravikumar, Zeye Liu, R. D. Shawn Blanton

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Characterization of Locked Combinational Circuits via ATPG.

Danielle Duvalsaint, Xiaoxiao Jin, Benjamin Niewenhuis, R. D. (Shawn) Blanton

Proceedings of the IEEE International Test Conference, 2019

2018

A Logic Test Chip for Optimal Test and Diagnosis.

Ben Niewenhuis

PhD thesis, 2018

2017

Multiple-defect diagnosis for Logic Characterization Vehicles.

Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Test chip design for optimal cell-aware diagnosability.

Soumya Mittal, Zeye Liu, Ben Niewenhuis, R. D. (Shawn) Blanton

Proceedings of the 2016 IEEE International Test Conference, 2016

Logic characterization vehicle design reflection via layout rewiring.

Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton

Proceedings of the 2016 IEEE International Test Conference, 2016

Achieving 100% cell-aware coverage by design.

Zeye Liu, Ben Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

Efficient built-in self test of regular logic characterization vehicles.

Ben Niewenhuis, Ronald D. Blanton

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Design reflection for optimal test-chip implementation.

R. D. (Shawn) Blanton, Benjamin Niewenhuis, Zeye (Dexter) Liu

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Logic characterization vehicle design for maximal information extraction for yield learning.

Ronald D. Blanton, Ben Niewenhuis, Carl Taylor

Proceedings of the 2014 International Test Conference, 2014

2013

SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states.

Ben Niewenhuis, Ronald D. Blanton, Mudit Bhargava, Ken Mai

Proceedings of the 2013 IEEE International Test Conference, 2013