Ben Kup

According to our database, Ben Kup authored at least 3 papers between 2000 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2010

A forward body bias generator for digital CMOS circuits with supply voltage scaling.

Maurice Meijer, José Pineda de Gyvez, Ben Kup, Bert van Uden, Peter Bastiaansen, Marco Lammers, Maarten Vertregt

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2002

Improved Test Monitor Circuit in Power Pin DfT.

Rodger Schuttert, Frans G. M. de Jong, Ben Kup

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2000

Power pin testing: making the test coverage complete.

Frans G. M. de Jong, Ben Kup, Rodger Schuttert

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000