Ben Bennetts

According to our database, Ben Bennetts authored at least 23 papers between 1971 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Electronics Design-for-Test: Past, Present and Future.

Ben Bennetts

Proceedings of the 12th European Test Symposium, 2007

2006

IEEE P1687: Toward Standardized Access of Embedded Instrumentation.

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote

Proceedings of the 2006 IEEE International Test Conference, 2006

New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG).

Bill Eklow, Ben Bennetts

Proceedings of the 11th European Test Symposium, 2006

2005

IJTAG (internal JTAG): a step toward a DFT standard.

Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts

Proceedings of the 2004 Design, 2004

2003

Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint.

Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts

IEEE Des. Test Comput., 2003

Guest Editors' Introduction: Board Test.

Monica Lobetti Bodoni, Ben Bennetts

IEEE Des. Test Comput., 2003

1999

Boundary Scan: The Internet of Test.

Mike Wondolowski, Ben Bennetts, Adam W. Ley

IEEE Des. Test Comput., 1999

Guest Editors' Introduction: Test and the Product Life Cycle.

Tony Ambler, Ben Bennetts

IEEE Des. Test Comput., 1999

1996

Built-In Self-Test: Assuring System Integrity.

Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie

Computer, 1996

1995

Guest Editor's Introduction.

Ben Bennetts

IEEE Des. Test Comput., 1995

1993

Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282.

Ben Bennetts

Microprocess. Microsystems, 1993

1992

Macro Testability: The Results of Production Device Applications.

Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Progress in DFT: A Personal View.

Ben Bennetts

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status.

R. G. Bennetts, A. Osseyran

J. Electron. Test., 1991

Scan Technology at Work.

R. G. Bennetts

Proceedings of the Fault-Tolerant Computing Systems, Tests, Diagnosis, 1991

1990

Test Technology in Europe.

Ben Bennetts

IEEE Des. Test Comput., 1990

1986

Digital test text caters for academia and researchers: Hideo Fujiwara 'Logic testing and design for testability' MIT Press, Cambridge, MA, USA (1985) £34.95 pp x + 284.

R. G. Bennetts

Microprocess. Microsystems, 1986

1979

Fault tolerance and digital systems.

R. G. Bennetts

Microprocess. Microsystems, 1979

1976

Recent Developments in the Theory and Practice of Testable Logic Design.

R. G. Bennetts, Roy V. Scott

Computer, 1976

1972

A realistic approach to detection test generation for combinatorial logic circuits.

R. G. Bennetts

Comput. J., 1972

1971

An Improved Method of Prime C-Class Derivation in the State Reduction of Sequential Networks.

R. G. Bennetts

IEEE Trans. Computers, 1971

Fault Diagnosis of Digital Systems - A Review.

Ben Bennetts, D. W. Lewin

Comput. J., 1971