Bei Deng
Orcid: 0009-0006-2236-5811Timeline
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Bibliography
2024
Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the 15th Asia-Pacific Symposium on Internetware, 2024