Bastien Beltrando

According to our database, Bastien Beltrando authored at least 6 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors.

Bastien Beltrando, Bruno Coppolelli, Jung-Bae Kim, Yang Ho Bae, Stephen Weeks, Lisa Enman, Ghazal Saheli, Davide Cornigli, Stuart Brinkley, Mark Saly, Luca Larcher, Dong Kil Yim, Milan Pesic

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Self-rectifying non-volatile tunneling synapse: multiscale modeling augmented development.

Bastien Beltrando, Marco A. Villena, Mondol Anik Kumar, Shruba Gangopadhyay, Deepak Kamalanathan, E. Smith, Nasrin Kazem, Ghazal Saheli, Stephen Weeks, Michael Haverty, Muthukumar Kaliappan, Andrea Padovani, S. Krishnan, Jeffrey W. Anthis, Luca Larcher, Milan Pesic

Proceedings of the IEEE International Memory Workshop, 2024

2023

Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND.

Milan Pesic, Bastien Beltrando, Tommaso Rollo, Cristian Zambelli, Andrea Padovani, Rino Micheloni, Rita Maji, Lisa Enman, Mark Saly, Yang Ho Bae, Jung-Bae Kim, Dong Kil Yim, Luca Larcher

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation.

Milan Pesic, Bastien Beltrando, Andrea Padovani, Toshihiko Miyashita, Nam-Sung Kim, Luca Larcher

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents.

Milan Pesic, Andrea Padovani, Tommaso Rollo, Bastien Beltrando, Jack Strand, Parnika Agrawal, Alexander L. Shluger, Luca Larcher

Proceedings of the IEEE International Memory Workshop, 2022

2021

Variability sources and reliability of 3D - FeFETs.

Milan Pesic, Bastien Beltrando, Andrea Padovani, Shruba Gangopadhyay, Muthukumar Kaliappan, Michael Haverty, Marco A. Villena, Enrico Piccinini, Matteo Bertocchi, Tony Chiang, Luca Larcher, Jack Strand, Alexander L. Shluger

Proceedings of the IEEE International Reliability Physics Symposium, 2021