Basab Datta

According to our database, Basab Datta authored at least 14 papers between 2007 and 2011.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2011

Temperature Effects on Practical Energy Optimization of Sub-Threshold Circuits in Deep Nanometer Technologies.

Basab Datta, Wayne P. Burleson

J. Low Power Electron., 2011

A 12.4μm² 133.4μW 4.56mV/°C resolution digital on-chip thermal sensing circuit in 45nm CMOS utilizing sub-threshold operation.

Basab Datta, Wayne P. Burleson

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

A high sensitivity and process tolerant digital thermal sensing scheme for 3-D Ics.

Basab Datta, Wayne P. Burleson

Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, 2011

A 45.6μ² 13.4μw 7.1v/v resolution sub-threshold based digital process-sensing circuit in 45nm CMOS.

Basab Datta, Wayne P. Burleson

Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, 2011

2010

Calibration of on-chip thermal sensors using process monitoring circuits.

Basab Datta, Wayne P. Burleson

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Thermal-aware voltage droop compensation for multi-core architectures.

Jia Zhao, Basab Datta, Wayne P. Burleson, Russell Tessier

Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

Circuit-level NBTI macro-models for collaborative reliability monitoring.

Basab Datta, Wayne P. Burleson

Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

Analysis and mitigation of NBTI-impact on PVT variability in repeated global interconnect performance.

Basab Datta, Wayne P. Burleson

Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

2009

Temperature effects on energy optimization in sub-threshold circuit design.

Basab Datta, Wayne P. Burleson

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

On temperature planarization effect of copper dummy fills in deep nanometer technology.

Basab Datta, Wayne P. Burleson

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

Low-power, process-variation tolerant on-chip thermal monitoring using track and hold based thermal sensors.

Basab Datta, Wayne P. Burleson

Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

2008

Temperature measurement in Content Addressable Memory cells using bias-controlled VCO.

Basab Datta, Wayne P. Burleson

Proceedings of the 21st Annual IEEE International SoC Conference, SoCC 2008, 2008

Collaborative sensing of on-chip wire temperatures using interconnect based ring oscillators.

Basab Datta, Wayne P. Burleson

Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008

2007

Low power on-chip thermal sensors based on wires.

Basab Datta, Wayne P. Burleson

Proceedings of the IFIP VLSI-SoC 2007, 2007