Bas Verhelst

According to our database, Bas Verhelst authored at least 5 papers between 1990 and 1992.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

1992

Using EDIF for Transfer of Test Data: Practical Experience.

Bas Verhelst, Richard Morren, Keith Baker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990

Using a Test-Specification Format in Automatic Test-Program Generation.

Bas Verhelst

IEEE Des. Test Comput., 1990

Development of a new standard for test.

William W. Sebesta, Bas Verhelst, Michael G. Wahl

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Functional and I_DDQ testing on a static RAM.

R. Meershoek, Bas Verhelst, Rory McInerney, Loek Thijssen

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

I_DDQ testing because 'zero defects isn't enough': a Philips perspective.

Keith Baker, Bas Verhelst

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990