Bappaditya Dey
Orcid: 0000-0002-0886-137X
According to our database1,
Bappaditya Dey
authored at least 38 papers
between 2013 and 2024.
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Bibliography
2024
Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes.
CoRR, 2024
An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection.
CoRR, 2024
Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.
CoRR, 2024
Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.
CoRR, 2024
2023
Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance.
CoRR, 2023
Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.
CoRR, 2023
Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.
CoRR, 2023
Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE.
CoRR, 2023
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.
CoRR, 2023
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.
CoRR, 2023
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach.
CoRR, 2023
SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation.
CoRR, 2023
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation.
CoRR, 2023
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering.
CoRR, 2023
2022
Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach.
CoRR, 2022
Proceedings of the 65th IEEE International Midwest Symposium on Circuits and Systems, 2022
A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection.
Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022
2021
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021
Proceedings of the IEEE International Symposium on Circuits and Systems, 2021
Proceedings of the 28th IEEE International Conference on Electronics, 2021
Proceedings of the 28th IEEE International Conference on Electronics, 2021
2020
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020
A Novel Design Reversible Logic Based Configurable Fault-Tolerant Embryonic Hardware.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
2019
Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019
Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019
2018
Neuro-NoC: Energy Optimization in Heterogeneous Many-Core NoC using Neural Networks in Dark Silicon Era.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the 2018 IEEE International Conference on Communications Workshops, 2018
A Low Power Hardware Implementation of Multi-Object DPM Detector for Autonomous Driving.
Proceedings of the 2018 IEEE International Conference on Acoustics, 2018
2017
Proceedings of the 2017 IEEE International Symposium on Signal Processing and Information Technology, 2017
Proceedings of the 2017 IEEE International High Level Design Validation and Test Workshop, 2017
2014
Segmentation of PET Images for Computer-Aided Functional Quantification of Tuberculosis in Small Animal Models.
IEEE Trans. Biomed. Eng., 2014
2013
Robust segmentation and accurate target definition for positron emission tomography images using Affinity Propagation.
Proceedings of the 10th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 2013