Baoping He

According to our database, Baoping He authored at least 8 papers between 2016 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Synergistic Radiation Effects in PPD CMOS Image Sensors Induced by Neutron Displacement Damage and Gamma Ionization Damage.

Zujun Wang, Yuanyuan Xue, Ning Tang, Gang Huang, Xu Nie, Shan-Kun Lai, Baoping He, Wuying Ma, Jiangkun Sheng, Shilong Gou

Sensors, March, 2024

2023

The Total Ionizing Dose Effects on Perovskite CsPbBr3 Semiconductor Detector.

Wuying Ma, Linyue Liu, Haoming Qin, Runlong Gao, Baoping He, Shilong Gou, Yihui He, Xiaoping Ouyang

Sensors, February, 2023

Impact of thermal baking before radiation on the total dose response of bipolar device.

Wuying Ma, Xiaoping Ouyang, Hongxia Guo, Pei Li, Baoping He, Zujun Wang, Shilong Gou, Yuanyuan Xue

Microelectron. J., 2023

2019

Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors.

Zujun Wang, Yuanyuan Xue, Wei Chen, Rui Xu, Hao Ning, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong

Sci. China Inf. Sci., 2019

2018

Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method.

Yuanyuan Xue, Zujun Wang, Wei Chen, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin

Sci. China Inf. Sci., 2018

2017

Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects.

Yuanyuan Xue, Zujun Wang, Wei Chen, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin

Sensors, 2017

Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods.

Yuanyuan Xue, Zujun Wang, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin

Sci. China Inf. Sci., 2017

2016

Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage.

Zujun Wang, Baoping He, Wuying Ma, Zhibin Yao, Shaoyan Huang, Minbo Liu, Jiangkun Sheng

J. Sensors, 2016