Baljit Kaur
Orcid: 0000-0002-4820-2336
According to our database1,
Baljit Kaur
authored at least 19 papers
between 2011 and 2024.
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Bibliography
2024
Design insights into a junctionless nanosheet FET (JL-NSFET) for switching and Analog/RF applications: Device to circuit level assessment.
Microelectron. J., 2024
2023
Int. J. Syst. Assur. Eng. Manag., October, 2023
2021
Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET.
IET Circuits Devices Syst., 2021
Performance Investigation of a Si/Ge Heterojunction Asymmetric Double Gate DLTFET Considering Temperature and ITC Variations.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021
DC and linearity performance of a novel Si0.6Ge0.4/Ge Dopingless Tunnel FET for ultra-low voltage applications.
Proceedings of the 4th International Symposium on Devices, Circuits and Systems, 2021
Proceedings of the IEEE International Conference on Communications Workshops, 2021
2020
Performance investigation of asymmetric double-gate doping less tunnel FET with Si/Ge heterojunction.
IET Circuits Devices Syst., 2020
Proceedings of the 3rd International Symposium on Devices, Circuits and Systems, 2020
Proceedings of the 3rd International Symposium on Devices, Circuits and Systems, 2020
2019
Scene perception system for visually impaired based on object detection and classification using multimodal deep convolutional neural network.
J. Electronic Imaging, 2019
A convolutional feature map-based deep network targeted towards traffic detection and classification.
Expert Syst. Appl., 2019
2018
A scene perception system for visually impaired based on object detection and classification using multi-modal DCNN.
CoRR, 2018
2016
A variation aware timing model for a 2-input NAND gate and its use in sub-65 nm CMOS standard cell characterization.
Microelectron. J., 2016
2015
Proceedings of the 19th International Symposium on VLSI Design and Test, 2015
2014
Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability.
IEEE Trans. Circuits Syst. I Regul. Pap., 2014
2013
An efficient method for ECSM characterization of CMOS inverter in nanometer range technologies.
Proceedings of the International Symposium on Quality Electronic Design, 2013
2012
Proceedings of the 1st International Conference on Recent Advances in Information Technology, 2012
Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012
2011
Efficient nanoscale VLSI standard cell library characterization using a novel delay model.
Proceedings of the 12th International Symposium on Quality Electronic Design, 2011