Balaji Narasimham
According to our database1,
Balaji Narasimham
authored at least 14 papers
between 2015 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2023
Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2021
Proceedings of the IEEE International Reliability Physics Symposium, 2021
Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Evaluation of the system-level SER performance of gigabit ethernet transceiver devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2015
Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015