B. L. Lin

According to our database, B. L. Lin authored at least 2 papers in 2015.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2015

Study of a new electromigration failure mechanism by novel test structure.

L. D. Chen, B. L. Lin, M.-H. Hsieh, C. W. Chang, J. S. Tsai, J. C. Peng, C. C. Chiu, Y.-H. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects.

C. W. Chang, S. E. Liu, B. L. Lin, C. C. Chiu, Y.-H. Lee, K. Wu

Proceedings of the IEEE International Reliability Physics Symposium, 2015