B. Kojecký

According to our database, B. Kojecký authored at least 5 papers between 2003 and 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2014

Influence of surface states on the reverse and noise properties of silicon power diodes.

Václav Papez, Jirí Hájek, B. Kojecký

IET Circuits Devices Syst., 2014

2012

Investigation of flicker noise in silicon diodes under reverse bias.

Jirí Hájek, Václav Papez, B. Kojecký

Microelectron. Reliab., 2012

2008

Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification.

Václav Papez, B. Kojecký, D. Sámal

Microelectron. J., 2008

2006

Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices.

B. Kojecký, Václav Papez, D. Sámal

Microelectron. J., 2006

2003

Transient effects on high voltage diode stack under reverse bias.

Václav Papez, B. Kojecký, J. Kozísek, J. Hejhal

Microelectron. Reliab., 2003