B. Beydoun

According to our database¹, B. Beydoun authored at least 3 papers between 2007 and 2010.

Collaborative distances:

Timeline

Book

In proceedings

Article

PhD thesis

Dataset

Other

2010

Characteristics degradation of the SiGe HBT under electromagnetic field stress.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2010

2007

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET.

[BibT_eX]

[DOI]

Microelectron. J., 2007