Azumi Kobayashi

According to our database, Azumi Kobayashi authored at least 2 papers between 2005 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis.

Sanae Seike, Ken Namura, Yukio Ohya, Anis Uzzaman, Shinichi Arima, Dale Meehl, Vivek Chickermane, Azumi Kobayashi, Satoshi Tanaka, Hiroyuki Adachi

Proceedings of the 15th Asian Test Symposium, 2006

2005

External memory BIST for system-in-package.

Kaname Yamasaki, Iwao Suzuki, Azumi Kobayashi, Keiichi Horie, Yasuharu Kobayashi, Hideyuki Aoki, Hideki Hayashi, Kenichi Tada, Koki Tsutsumida, Keiichi Higeta

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005