Aymen Ladhar

According to our database, Aymen Ladhar authored at least 12 papers between 2009 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

On Using Cell-Aware Methodology for SRAM Bit Cell Testing.

Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2023

2022

A Comprehensive Learning-Based Flow for Cell-Aware Model Generation.

P. D'Hondt, Aymen Ladhar, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2022

2021

Cell-Aware Diagnosis of Customer Returns Using Bayesian Inference.

Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar

Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

A Learning-Based Methodology for Accelerating Cell-Aware Model Generation.

P. D'Hondt, Aymen Ladhar, Patrick Girard, Arnaud Virazel

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns.

Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar

Proceedings of the IEEE International Test Conference, 2020

Learning-Based Cell-Aware Defect Diagnosis of Customer Returns.

Safa Mhamdi, Patrick Girard, Arnaud Virazel, Alberto Bosio, Aymen Ladhar

Proceedings of the IEEE European Test Symposium, 2020

2019

Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip.

Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2010

Extraction and Simulation of Intra-gate Defects Affecting CMOS Libraries.

Aymen Ladhar, Mohamed Masmoudi

J. Comput., 2010

An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis.

Aymen Ladhar, Mohamed Masmoudi

J. Electron. Test., 2010

2009

A novel algorithm to extract open defects from industrial designs.

Aymen Ladhar, Mohamed Masmoudi

Proceedings of the 16th IEEE International Conference on Electronics, 2009

Analysis and diagnosis of multiple simultaneous defects.

Aymen Ladhar, Mohamed Masmoudi

Proceedings of the 16th IEEE International Conference on Electronics, 2009

Efficient and accurate method for intra-gate defect diagnoses in nanometer technology and volume data.

Aymen Ladhar, Mohamed Masmoudi, Laroussi Bouzaida

Proceedings of the Design, Automation and Test in Europe, 2009