Ayhan A. Mutlu
According to our database1,
Ayhan A. Mutlu
authored at least 7 papers
between 2003 and 2013.
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Bibliography
2013
A new statistical methodology predicting chip failure probability considering electromigration.
Microelectron. Reliab., 2013
Statistical Electromigration analysis of a chip with the consideration of a within-die temperature map.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
2009
Parametric analysis to determine accurate interconnect extraction corners for design performance.
Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009
Proceedings of the 46th Design Automation Conference, 2009
2007
An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007
2006
Statistical circuit performance variability minimization under manufacturing variations.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
2003
Concurrent optimization of process dependent variations in different circuit performance measures.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003