Avi Karsenty

According to our database, Avi Karsenty authored at least 10 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

From Passive to Active: Towards Optical Communication with Reconfigured Nanoelectronics Devices.

Avi Karsenty

Proceedings of the 24th International Conference on Transparent Optical Networks, 2024

2023

Overcoming Silicon Limitations Short Review: How Geometrical Innovation Can Revolutionize Nanophotonics and Nanoelectronics.

Avi Karsenty

Proceedings of the 23rd International Conference on Transparent Optical Networks, 2023

2020

Design of Surface Enhanced Raman Scattering (SERS) Nanosensor Array.

Yaakov Mandelbaum, Raz Mottes, Zeev Zalevsky, David Zitoun, Avi Karsenty

Sensors, 2020

A Comprehensive Review of Integrated Hall Effects in Macro-, Micro-, Nanoscales, and Quantum Devices.

Avi Karsenty

Sensors, 2020

2019

Computer Algebra Challenges in Nanotechnology: Accurate Modeling of Nanoscale Electro-optic Devices Using Finite Elements Method.

Avi Karsenty, Yaakov Mandelbaum

Math. Comput. Sci., 2019

Label Free Super-Resolved Nanoscopy: PALM-Like, STED-Like and Hybrid AFM/NSOM.

Avi Karsenty, Avraham Chelly, M. Sinvani, H. Pinhas, Omer Wagner, Yossef Danan, Zeev Zalevsky

Proceedings of the 21st International Conference on Transparent Optical Networks, 2019

2017

Study of the Photo- and Thermoactivation Mechanisms in Nanoscale SOI Modulator.

Yaakov Mandelbaum, Ariel Zev, Avraham Chelly, Zeev Zalevsky, Avi Karsenty

J. Sensors, 2017

Small Signals' Study of Thermal Induced Current in Nanoscale SOI Sensor.

Yaakov Mandelbaum, Ilan Gadasi, Avraham Chelly, Zeev Zalevsky, Avi Karsenty

J. Sensors, 2017

Improving Interferometry Instrumentation by Mixing Stereoscopy for 2π Ambiguity Solving.

Avi Karsenty, Yaron Lichtenstadt, Sagi Naeim, Yoel Arieli

Int. J. Meas. Technol. Instrum. Eng., 2017

Full Field Imaging Ellipsometry (FFIE) Platform Using CCD Camera and Advanced Software for Simultaneous Spots' Sensing and Measurement.

Avi Karsenty, Shmuel Feldman, Zvi Veig, Yoel Arieli

Int. J. Meas. Technol. Instrum. Eng., 2017