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2021
36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In.
[DOI]
Kunyang Liu
,
Zihan Fu
,
Gen Li
,
Hongliang Pu
,
Zhibo Guan
,
Xingyu Wang
,
Xinpeng Chen
,
Hirofumi Shinohara
Proceedings of the IEEE International Solid-State Circuits Conference, 2021