Radiation-Hardened Designs for Soft-Error-Rate Reduction by Delay-Adjustable D-Flip-Flops.
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017
Fast-yet-accurate variation-aware current and voltage modelling of radiation-induced transient fault.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016