2019
ESD-Reliability Investigation <sup>1</sup>of an UHV Elliptical LDMOS-SCR by the Drain-Side Junction Replacement.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019

Channel- & Drift Region's STI-Lengths Impacts of ESD Immunity in HV 60 V nLDMOS Devices.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019

Evaluating the Drift-Region Length Effect of nLDMOS on ESD Ability with a TLP Testing System.
Proceedings of the IEEE 8th Global Conference on Consumer Electronics, 2019

ESD Immunity Impacts of the Drain-Side Heterojunction Device Addition in HV 60 V n/pLDMOS Devices.
Proceedings of the IEEE 8th Global Conference on Consumer Electronics, 2019