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2015
New TDDB lifetime model for AC inverter-like stress in advance FinFET structure.
[DOI]
I. K. Chen
,
C. L. Chen
,
Y.-H. Lee
,
R. Lu
,
Y. W. Lee
,
H. H. Hsu
,
Y. W. Tseng
,
Y. W. Lin
,
J. R. Shih
Proceedings of the IEEE International Reliability Physics Symposium, 2015