Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., March, 2025
Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning.
CoRR, 2024
Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.
Proceedings of the IEEE International Test Conference, 2023
Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing.
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Proceedings of the IEEE International Test Conference, 2022
Fast Gate Leakage Current Monitor With Large Dynamic Range.
IEEE Trans. Circuits Syst. II Express Briefs, 2021
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018
An on-chip ADC BIST solution and the BIST enabled calibration scheme.
Proceedings of the IEEE International Test Conference, 2017
Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test.
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014