Optimal planning of step-stress accelerated degradation test based on Tweedie exponential dispersion process with random effects.
Qual. Reliab. Eng. Int., October, 2024
Optimal design of step-stress accelerated degradation tests based on the Tweedie exponential dispersion process.
Reliab. Eng. Syst. Saf., 2023
FPGAN: An FPGA Accelerator for Graph Attention Networks With Software and Hardware Co-Optimization.
IEEE Access, 2020
S-GAT: Accelerating Graph Attention Networks Inference on FPGA Platform with Shift Operation.
Proceedings of the 26th IEEE International Conference on Parallel and Distributed Systems, 2020