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2009
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs.
[DOI]
Nathalie Malbert
,
Nathalie Labat
,
Arnaud Curutchet
,
C. Sury
,
V. Hoel
,
J.-C. de Jaeger
,
Nicolas Defrance
,
Y. Douvry
,
Christian Dua
,
Mourad Oualli
,
C. Bru-Chevallier
,
Jean-Marie Bluet
,
W. Chikhaoui
Microelectron. Reliab., 2009
2004
Reliability Investigation of Gallium Nitride HEMT.
[DOI]
A. Sozza
,
Christian Dua
,
Erwan Morvan
,
Bertrand Grimbert
,
V. Hoel
,
Sylvain L. Delage
,
N. Chaturvedi
,
Richard Lossy
,
Joachim Würfl
Microelectron. Reliab., 2004