Machine Learning Assisted Challenge Selection for Modeling Attack Resistance in Strong PUFs.
Proceedings of the International Symposium on VLSI Design, Automation and Test, 2021
Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology.
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Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012
Modified LC-tank ESD protection design for 60-GHz RF applications.
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Proceedings of the 20th European Conference on Circuit Theory and Design, 2011